发明名称 NON-DESTRUCTIVE X-RAY INSPECTION APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To accurately adjust the intensity of X-rays allowed to irradiate an object to be inspected. SOLUTION: A non-destructive X-ray inspection apparatus is constituted so that the positional data of the noticeable scanning line in a fluoroscopic image necessary for adjusting the intensity of X-rays in preliminarily incorporated in the control program of a program memory 12 and the fluoroscopic image due to X-ray fluoroscopy performed prior to X-ray CT(computed tomography) photographing is stored in a fluoroscopic image memory 13, and the image of the noticeable scanning line in the stored fluoroscopic image is read from the fluoroscopic image memory 13 by a computer 5 to be automatically displayed on the screen of a display monitor 8 as the signal intensity profile of an image signal. By this constitution, the intensity of X-rays can be adjusted more accurately than ever.</p>
申请公布号 JP2001059824(A) 申请公布日期 2001.03.06
申请号 JP19990237280 申请日期 1999.08.24
申请人 SHIMADZU CORP 发明人 HIROOKA KEN
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
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