发明名称 METHOD AND APPARATUS FOR CALIBRATING POSITIONS OF A PLURALITY OF FIRST LIGHT SOURCES ON A FIRST PART
摘要 A method for calibrating positions (11) of a plurality of first light sources (1) on a first part (2) when the first light sources (1) are attached thereto, including the steps of measuring first positions (3i) of the plurality of first light sources (1), each of which first light sources (1) is either an active light source or an illuminable reflecting point, generating a first light source to facet mapping (4), which first light source to facet mapping (4) specifies which facet (9i) of the first part (2) the first light sources (1) are located on, estimating a transformation (5) that transforms the first positions (3i) into a co-ordinate frame of the first part (7), thereby generating estimated positions (6i) of the first light sources (1) on the first part (2), which estimated positions (6i) are in the co-ordinate frame of the first part (7), calculating (10a) first distances (8i) from the estimated positions (6i) to respective facets (9i) of the first part (2), inputting the first distances (6i) into a least mean squares (LMS) errors function (10b) so as to generate a plurality errors, and optimising said errors so as to locate the positions (11) of said plurality of first light sources on the first part.
申请公布号 WO0104570(A1) 申请公布日期 2001.01.18
申请号 WO2000GB02526 申请日期 2000.06.29
申请人 BAE SYSTEMS PLC;GOOCH, RICHARD, MICHAEL 发明人 GOOCH, RICHARD, MICHAEL
分类号 G01B11/00;G01B11/03;G01B11/26;G01B21/04;G06F17/50;G06T1/00;(IPC1-7):G01B11/00 主分类号 G01B11/00
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