发明名称 CIRCUIT AND METHOD FOR TESTING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To make the contact between the measuring terminal of a measuring instrument and the input-output terminal of a semiconductor device confirmable with a simple circuit, by providing transistors the control terminals of which are commonly connected to a control signal inputting terminal, and which are set to conducting states at testing time by maintaining a control signal at a prescribed level by the number of input-output terminals. SOLUTION: When contact confirmation is performed by using a testing circuit, a high-level enable signal ENB is inputted from a signal terminal 6 and maintained at a high level during tests. Then a contact confirmation signal Sc which changes from a high level to a low level, or vice versa, is inputted from another signal terminal 7. Simultaneously, the potential at each measuring terminal is inputted to a measuring instrument. When the inputted potential of one measuring terminal coincides with the potential of the contact confirmation signal Sc, it can be confirmed that the measuring terminal is normally connected to its corresponding input-output terminal. When the inputted potential is different from the potential of the signal Sc, on the contrary, it can be confirmed that the measuring terminal is not normally connected to the corresponding input-output terminal.
申请公布号 JP2000221247(A) 申请公布日期 2000.08.11
申请号 JP19990026244 申请日期 1999.02.03
申请人 SONY CORP 发明人 TAKAGI TOSHIJI
分类号 G01R31/28;G01R31/02;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R31/28
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