发明名称 |
DEVICE AND METHOD FOR MEASURING THICKNESS OF GLASS MATERIAL |
摘要 |
PROBLEM TO BE SOLVED: To nondestructively measure the thickness of each layer of a double- glazing material. SOLUTION: An ultraviolet ray emitted from a light source 2 gets incident into a collimator lens 3 to be brought into parallel light, and gets into a double- glazing material 1 at 45 deg. of incident angle. Light scattered in ranges of both end faces A-C of the double glazing material 1 is imaged by an imaging lens 5, and is received by a CCD 6 (charge coupled device). Intensity of the scattered light in the thickness direction of the double glazing material 1 is input into an operation part 7 to find a thickness of the first glass layer 1a.
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申请公布号 |
JP2000221009(A) |
申请公布日期 |
2000.08.11 |
申请号 |
JP19990020786 |
申请日期 |
1999.01.28 |
申请人 |
SUMITOMO METAL IND LTD |
发明人 |
KUSUNOKI KAZUHIKO;YAMADE YOSHIAKI;ARAHORI TADAHISA |
分类号 |
G01B11/06;(IPC1-7):G01B11/06 |
主分类号 |
G01B11/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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