发明名称 DEVICE AND METHOD FOR MEASURING THICKNESS OF GLASS MATERIAL
摘要 PROBLEM TO BE SOLVED: To nondestructively measure the thickness of each layer of a double- glazing material. SOLUTION: An ultraviolet ray emitted from a light source 2 gets incident into a collimator lens 3 to be brought into parallel light, and gets into a double- glazing material 1 at 45 deg. of incident angle. Light scattered in ranges of both end faces A-C of the double glazing material 1 is imaged by an imaging lens 5, and is received by a CCD 6 (charge coupled device). Intensity of the scattered light in the thickness direction of the double glazing material 1 is input into an operation part 7 to find a thickness of the first glass layer 1a.
申请公布号 JP2000221009(A) 申请公布日期 2000.08.11
申请号 JP19990020786 申请日期 1999.01.28
申请人 SUMITOMO METAL IND LTD 发明人 KUSUNOKI KAZUHIKO;YAMADE YOSHIAKI;ARAHORI TADAHISA
分类号 G01B11/06;(IPC1-7):G01B11/06 主分类号 G01B11/06
代理机构 代理人
主权项
地址