发明名称 FABRICATION METHOD OF CAPACITOR FOR SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A fabrication method of capacitor for semiconductor memory device is provided to increase the effective area for a lower electrode and prevent the degradation of a dielectric film. CONSTITUTION: A fabrication method of capacitor for semiconductor memory device comprises steps of: selectively etching an insulation film to form a contact hole and forming a polysilicon plug within the contact hole; forming an insulation film on overall structure and selectively etching the insulation film to form a trench exposing the plug; forming a bonding film on the bottom of the trench; forming a level dielectric film on the bonding film and the side wall of the trench; forming a lower electrode on the level dielectric film; forming a dielectric film; and forming an upper electrode.
申请公布号 KR20000044555(A) 申请公布日期 2000.07.15
申请号 KR19980061054 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 YOU, YONG SIK;CHO, HO JIN
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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