发明名称 |
FABRICATION METHOD OF CAPACITOR FOR SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A fabrication method of capacitor for semiconductor memory device is provided to increase the effective area for a lower electrode and prevent the degradation of a dielectric film. CONSTITUTION: A fabrication method of capacitor for semiconductor memory device comprises steps of: selectively etching an insulation film to form a contact hole and forming a polysilicon plug within the contact hole; forming an insulation film on overall structure and selectively etching the insulation film to form a trench exposing the plug; forming a bonding film on the bottom of the trench; forming a level dielectric film on the bonding film and the side wall of the trench; forming a lower electrode on the level dielectric film; forming a dielectric film; and forming an upper electrode.
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申请公布号 |
KR20000044555(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980061054 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
YOU, YONG SIK;CHO, HO JIN |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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