发明名称 METHOD FOR MANUFACTURING CAPACITOR OF MEMORY DEVICE
摘要 PURPOSE: A capacitor manufacturing method of a memory device is to form a diffusion prevention film with an excellent heat stableness for preventing a capacitor from degrading due to an oxidation of a barrier metal. CONSTITUTION: A method for fabricating a capacitor of a memory device comprises the steps of: forming a contact plug for a vertical interconnection; forming a barrier metal layer(205) on the contact plug; forming a lower electrode layer(206) on the barrier metal layer; forming a lower electrode pattern by etching the lower electrode layer and the barrier metal layer; depositing an insulating film(202) on the substrate whole surface with the lower electrode layer formed thereon by a high density plasma chemical vapor deposition method; wet etching the insulating film so that sidewalls of at least the barrier metal layer are coated; and depositing a (Ba,Sr)TiO3 dielectric(208) and an upper electrode(209).
申请公布号 KR20000041396(A) 申请公布日期 2000.07.15
申请号 KR19980057255 申请日期 1998.12.22
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 HONG, GWON
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址