发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF MEMORY DEVICE |
摘要 |
PURPOSE: A capacitor manufacturing method of a memory device is to form a diffusion prevention film with an excellent heat stableness for preventing a capacitor from degrading due to an oxidation of a barrier metal. CONSTITUTION: A method for fabricating a capacitor of a memory device comprises the steps of: forming a contact plug for a vertical interconnection; forming a barrier metal layer(205) on the contact plug; forming a lower electrode layer(206) on the barrier metal layer; forming a lower electrode pattern by etching the lower electrode layer and the barrier metal layer; depositing an insulating film(202) on the substrate whole surface with the lower electrode layer formed thereon by a high density plasma chemical vapor deposition method; wet etching the insulating film so that sidewalls of at least the barrier metal layer are coated; and depositing a (Ba,Sr)TiO3 dielectric(208) and an upper electrode(209).
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申请公布号 |
KR20000041396(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980057255 |
申请日期 |
1998.12.22 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
HONG, GWON |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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