发明名称 DIFFERENTIAL THERMOANALYSIS DEVICE
摘要 According to the invention, the differential thermoanalysis arrangement (10) conducts the metrological examination or determination of a test sample parameter, especially of phase transitions or the specific heat of the test sample. The invention has a heat source (12) coupled a sensor plate (16) coupled thereto. A test sample coupling zone (18) for thermal coupling of a test sample (20) which is to be measured and a reference test coupling zone (22) for thermal coupling of a reference test (24) with a known behavior as regards the parameters which are to be examined or measured, are arranged on said sensor plate. The sensor plate (16) has at least one ceramic or one monocrystalline or polycrystalline thermoelectric semi-conducive material within its test sample coupling zone (18) and its reference test coupling zone (22).
申请公布号 EP1007952(A1) 申请公布日期 2000.06.14
申请号 EP19980945284 申请日期 1998.08.25
申请人 DEUTSCHES ZENTRUM FUER LUFT- UND RAUMFAHRT E.V. 发明人 SCHILZ, JUERGEN;MUELLER, WOLF, ECKHARD;BAEHR, GERHARD;RAUSCHER, LUTZ
分类号 G01N25/48 主分类号 G01N25/48
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