发明名称 Method for manufacturing thin semiconductor device
摘要 In a method for manufacturing a semiconductor device, a semiconductor wafer having a front surface with semiconductor elements and a back surface with no semiconductor elements is prepared, and the back surface of the semiconductor wafer is etched to form a first wall on the back surface of the semiconductor wafer in its periphery and a second wall of a grid configuration constructed by two stripes on the back surface of said semiconductor wafer within the first wall. The second wall is connected to the first wall.
申请公布号 US6074948(A) 申请公布日期 2000.06.13
申请号 US19990252978 申请日期 1999.02.19
申请人 NEC CORPORATION 发明人 NAGAI, KEIJI
分类号 H01L23/12;H01L21/301;H01L21/306;H01L21/768;H01L21/78;H01L23/367;H01L23/373;(IPC1-7):H01L21/302 主分类号 H01L23/12
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