发明名称 Method and apparatus for efficiently heating semiconductor wafers or reticles
摘要 A method and apparatus for efficiently heating for instance a semiconductor wafer or reticle substrate in either vacuum or air, by exposing the wafer or reticle to radiation whose spectrum is such that it includes only wavelengths which have been determined to be efficiently absorbed by the material of the wafer or reticle. This advantageously allows more rapid and uniform heating than is allowed by prior art broadband radiation, convection heating, or conduction. The wavelength and bandwidth of the radiation are selected to be those wavelengths efficiently absorbed by the wafer or reticle, depending on its particular material and thickness. Typical applications are to a wafer or reticle located in a vacuum where convection or conduction heating are inconvenient or absent.
申请公布号 US5954982(A) 申请公布日期 1999.09.21
申请号 US19970800896 申请日期 1997.02.12
申请人 NIKON CORPORATION 发明人 SOGARD, MICHAEL R.
分类号 G03F7/20;H01L21/00;H01L21/324;(IPC1-7):H05B1/02;H01L21/20 主分类号 G03F7/20
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