发明名称 SUBSTRATE HOLDER AND ALIGNER
摘要 <p>PROBLEM TO BE SOLVED: To improve response for the temp. control of a wafer. SOLUTION: A wafer W1 exposed to an X-ray L1 is held with a wafer stage in a hermetically sealed exposure chamber 3 and vacuum-chucked by a wafer chuck 10, having an inner piping in which a temp.-adjusting fluid flows to control the temp. of the wafer. This fluid becomes a thermostatic water, due to a second temp.-adjusting unit 14 disposed outside the exposure chamber 3 and a second temp. adjusting unit 15 integrated with the wafer chuck 10 which finely adjusts the thermostatic water.</p>
申请公布号 JPH10223520(A) 申请公布日期 1998.08.21
申请号 JP19970035593 申请日期 1997.02.04
申请人 CANON INC 发明人 CHIBA YUJI;HARA SHINICHI
分类号 G21K5/02;G03F7/20;H01L21/027;H01L21/683;(IPC1-7):H01L21/027;H01L21/68 主分类号 G21K5/02
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