发明名称 METHOD FOR ANALYZING IMPURITIES IN GAS AND ITS ANALYZER
摘要 <p>Object gas is ionized and the intensity of cluster ions produced from the main component gas and the impurity gas in the object gas is measured by a mass spectrometer (6) to determine the amount of impurity gas in the object gas. An analyzer for impurities in object gas comprises a mass spectrometer (6) which has a means for ionizing the introduced gas, an analysis line (4) through which the object gas is introduced into the mass spectrometer (6) and a calibration line (10) which introduces the object gas into the mass spectrometer (6) after the impurity concentration in the object gas is controlled. &lt;IMAGE&gt;</p>
申请公布号 EP0857969(A1) 申请公布日期 1998.08.12
申请号 EP19970935876 申请日期 1997.08.26
申请人 NIPPON SANSO CORPORATION 发明人 NISHINA, AKIRA;UMEHARA, HITOMI;KIMIJIMA, TETSUYA
分类号 H01J49/04;(IPC1-7):G01N27/62 主分类号 H01J49/04
代理机构 代理人
主权项
地址