发明名称 |
METHOD FOR ANALYZING IMPURITIES IN GAS AND ITS ANALYZER |
摘要 |
<p>Object gas is ionized and the intensity of cluster ions produced from the main component gas and the impurity gas in the object gas is measured by a mass spectrometer (6) to determine the amount of impurity gas in the object gas. An analyzer for impurities in object gas comprises a mass spectrometer (6) which has a means for ionizing the introduced gas, an analysis line (4) through which the object gas is introduced into the mass spectrometer (6) and a calibration line (10) which introduces the object gas into the mass spectrometer (6) after the impurity concentration in the object gas is controlled. <IMAGE></p> |
申请公布号 |
EP0857969(A1) |
申请公布日期 |
1998.08.12 |
申请号 |
EP19970935876 |
申请日期 |
1997.08.26 |
申请人 |
NIPPON SANSO CORPORATION |
发明人 |
NISHINA, AKIRA;UMEHARA, HITOMI;KIMIJIMA, TETSUYA |
分类号 |
H01J49/04;(IPC1-7):G01N27/62 |
主分类号 |
H01J49/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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