发明名称 |
System for characterizing semiconductor materials and photovoltaic devices through calibration |
摘要 |
A method and apparatus for measuring characteristics of a piece of material, typically semiconductor materials including photovoltaic devices. The characteristics may include dislocation defect density, grain boundaries, reflectance, external LBIC, internal LBIC, and minority carrier diffusion length. The apparatus includes a light source, an integrating sphere, and a detector communicating with a computer. The measurement or calculation of the characteristics is calibrated to provide accurate, absolute values. The calibration is performed by substituting a standard sample for the piece of material, the sample having a known quantity of one or more of the relevant characteristics. The quantity measured by the system of the relevant characteristic is compared to the known quantity and a calibration constant is created thereby.
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申请公布号 |
US5757474(A) |
申请公布日期 |
1998.05.26 |
申请号 |
US19950496061 |
申请日期 |
1995.06.28 |
申请人 |
MIDWEST RESEARCH INSTITUTE |
发明人 |
SOPORI, BHUSHAN L.;ALLEN, LARRY C.;MARSHALL, CRAIG;MURPHY, ROBERT C.;MARSHALL, TODD |
分类号 |
G01N21/95;(IPC1-7):G01N21/88 |
主分类号 |
G01N21/95 |
代理机构 |
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主权项 |
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地址 |
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