摘要 |
A process for producing a semiconductor structure for ICs, especially DRAMs or FeRAMs, involves forming a stacked cell from a plug-filled via in an insulating layer (2) and applying a capacitor having a lower electrode (5) facing the plug (1), a paraelectric or ferroelectric dielectric (6) and an upper electrode (7). The novelty is that, after etching the via (9) and filling it with plug material (1), (a) a recess is formed in the plug material (1); (b) the plug material (1) and the surrounding insulating layer (2) are exposed to nitrogen-containing gas to form a silicon nitride layer (4) on the insulating layer (2) and a nitride barrier layer on the plug material (1) exposed in the recess; and then (c) the lower electrode (5), the dielectric (6) and the upper electrode (7) are successively applied and structured.
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申请人 |
SIEMENS AG, 80333 MUENCHEN, DE |
发明人 |
HARTNER, WALTER, DIPL.-PHYS.-UNIV., 89441 MEDLINGEN, DE;GSCHWANDTNER, ALEXANDER, DR.RER.NAT., 80687 MUENCHEN, DE;MAZURE, CARLOS, DR.RER.NAT., 85614 KIRCHSEEON, DE |