发明名称 Stacked cell capacitor-containing integrated circuit production
摘要 A process for producing a semiconductor structure for ICs, especially DRAMs or FeRAMs, involves forming a stacked cell from a plug-filled via in an insulating layer (2) and applying a capacitor having a lower electrode (5) facing the plug (1), a paraelectric or ferroelectric dielectric (6) and an upper electrode (7). The novelty is that, after etching the via (9) and filling it with plug material (1), (a) a recess is formed in the plug material (1); (b) the plug material (1) and the surrounding insulating layer (2) are exposed to nitrogen-containing gas to form a silicon nitride layer (4) on the insulating layer (2) and a nitride barrier layer on the plug material (1) exposed in the recess; and then (c) the lower electrode (5), the dielectric (6) and the upper electrode (7) are successively applied and structured.
申请公布号 DE19640448(C1) 申请公布日期 1998.02.19
申请号 DE19961040448 申请日期 1996.09.30
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 HARTNER, WALTER, DIPL.-PHYS.-UNIV., 89441 MEDLINGEN, DE;GSCHWANDTNER, ALEXANDER, DR.RER.NAT., 80687 MUENCHEN, DE;MAZURE, CARLOS, DR.RER.NAT., 85614 KIRCHSEEON, DE
分类号 H01L21/02;(IPC1-7):H01L21/824;H01L21/283 主分类号 H01L21/02
代理机构 代理人
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