发明名称 X-RAY DIFFRACTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To easily adjust a monochrometer, by reducing the number of parts to be adjusted in the monochrometer for an X-ray diffraction apparatus using a curved crystal. SOLUTION: A diffraction X-ray P from a sample through a detection slit 8 enters a spectral crystal 9 while spreading. Only Kαrays are reflected by the spectral crystal 9 and detected by a detector 10 set adjacent to the crystal 9. What is to be adjusted in this monochrometer is solely the distance between the detection slit and the spectral crystal and a rotating position of the spectral crystal. The rotating position of the spectral crystal 9 mounted to a crystal rotary stage 13 is adjusted by manipulating a crystal rotation knob 14 so that the intensity of detected X rays becomes maximum.
申请公布号 JPH09229881(A) 申请公布日期 1997.09.05
申请号 JP19960041716 申请日期 1996.02.28
申请人 SHIMADZU CORP 发明人 TAKASHIMA TORU;FUJIWARA TADAYUKI;WATANABE KAZUYUKI
分类号 G01N23/207;G01N23/20;G21K1/06;(IPC1-7):G01N23/207 主分类号 G01N23/207
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