发明名称 SIGNAL LINK TEST MESSAGE STRUCTURE IN THE COMMON CHANNEL SIGNALING NETWORK OF ELECTRONIC SWITCHING SYSTEM
摘要 a test form bit (5) allotted n x 8 (1< n <15) bits; a length display bit (6) which is located next to the test form bit (5) and is allotted 4 bits; a spare bit (7) which is located next to the length display bit (6) and is allotted 4 bits; a head sign H1 bit (8) allotted 4 bits; a head sign H2 bit (9) allotted 4 bits; a rooting label bit (10) which is located next to the head sign H2 bit and is allotted 32 bits.
申请公布号 KR960008677(B1) 申请公布日期 1996.06.28
申请号 KR19930029182 申请日期 1993.12.22
申请人 KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE;KOREA TELECOM 发明人 KANG, KYUNG - HOON;KIM, HWA - SOOK;CHO, YOUNG - SO;LEE, YUN - JOO
分类号 H04L12/24;(IPC1-7):H04L12/24 主分类号 H04L12/24
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