发明名称 |
SIGNAL LINK TEST MESSAGE STRUCTURE IN THE COMMON CHANNEL SIGNALING NETWORK OF ELECTRONIC SWITCHING SYSTEM |
摘要 |
a test form bit (5) allotted n x 8 (1< n <15) bits; a length display bit (6) which is located next to the test form bit (5) and is allotted 4 bits; a spare bit (7) which is located next to the length display bit (6) and is allotted 4 bits; a head sign H1 bit (8) allotted 4 bits; a head sign H2 bit (9) allotted 4 bits; a rooting label bit (10) which is located next to the head sign H2 bit and is allotted 32 bits.
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申请公布号 |
KR960008677(B1) |
申请公布日期 |
1996.06.28 |
申请号 |
KR19930029182 |
申请日期 |
1993.12.22 |
申请人 |
KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE;KOREA TELECOM |
发明人 |
KANG, KYUNG - HOON;KIM, HWA - SOOK;CHO, YOUNG - SO;LEE, YUN - JOO |
分类号 |
H04L12/24;(IPC1-7):H04L12/24 |
主分类号 |
H04L12/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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