发明名称 Test circuit for back-up battery
摘要 A test circuit for a back-up battery includes a main switch which connects a main power source to a load, and a diode which is interposed between a back-up battery and the load. The diode is reversed biased when the main power source supplies rated power to the load. To test the battery, the main switch is turned off such that the back-up battery supplies operating current to the load via the diode. During a test interval, the output voltage is monitored to determine if the battery is able to supply its rated voltage under load. After the test or if the battery fails to supply requisite voltage, the main switch is turned-on again.
申请公布号 US5528149(A) 申请公布日期 1996.06.18
申请号 US19940363670 申请日期 1994.12.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHEN, ZHONG X.
分类号 G01R31/36;H01M10/44;H02J9/06;(IPC1-7):H01M10/44 主分类号 G01R31/36
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