| 摘要 |
PURPOSE:To provide an excellent capacitor testing method by which defective products can be easily and surely sorted and rejected from numerous capacitor products. CONSTITUTION:A CPU 3 controls a DC constant-current constant-voltage power source 2 to apply a DC constant-current overvoltage pulse to a sample capacitor 10 under a fixed condition. During a fixed detecting period of time T, a behavior voltage detector 6 monitors the voltage value of the rectangular pulse applied to the capacitor 10 and, at the same time, compares the behavior voltage value of the monitored voltage value with a preset limit behavior voltage value. When the behavior voltage value of the monitored voltage value is higher than the limit value, the detector 6 outputs an abnormality detecting signal to the CPU 3. |
