SEMICONDUCTOR CHIP TEST MOUNTING METHOD AND TEST SUBSTRATE,申请号JP19940095265-传众专利搜索

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发明名称	SEMICONDUCTOR CHIP TEST MOUNTING METHOD AND TEST SUBSTRATE
摘要
申请公布号	JPH07301658(A)	申请公布日期	1995.11.14
申请号	JP19940095265	申请日期	1994.05.09
申请人	FUJITSU LTD	发明人	YOSHIDA EIJI
分类号	G01R31/26;H01L21/66;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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