| 摘要 |
The output signal and control signal from an internal circuit are supplied to a control circuit via an output signal line and a control signal line. The output signal from the control circuit is supplied to a first and second independent output buffer sections via control circuit output signal lines, respectively. The outputs of the first and second output buffer sections are selectively supplied from an output terminal to an external circuit via an output signal line. With this invention, it is possible to selectively use the output buffer sections having an ability according to use. Another semiconductor integrated circuit device comprises an internal circuit, a plurality of output buffers, a control circuit for selectively actuating the output buffers, and a sequential select circuit for sequentially selecting the plurality of output buffers. Because it is possible to selectively bring only an output terminal on which an electric characteristics test is to be conducted into a normal operating state and the other output terminals into a high impedance state, an accurate test can be carried out without impairing the ease of setting the expected value for the output terminals.
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