发明名称 |
Laser interferometer type length measuring apparatus and positioning method using the same |
摘要 |
In a laser interferometer type length measuring apparatus, a measurement laser beam will be influenced by disturbance such as air fluctuation and a change in air pressure distribution due to movement of an object so that a displacement of the object cannot be accurately measured. In order to obviate such an inconvenience, air controlled at a predetermined temperature is uniformly blown at a fixed speed on the entire optical path of the measurement laser beam.
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申请公布号 |
US5141318(A) |
申请公布日期 |
1992.08.25 |
申请号 |
US19910664603 |
申请日期 |
1991.03.04 |
申请人 |
HITACHI, LTD. |
发明人 |
MIYAZAKI, CHUICHI;SAKAIZAWA, HIDEYUKI;KURIHARA, MAKOTO |
分类号 |
G01B9/02;G01B11/00;G03F7/20 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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