发明名称 Laser interferometer type length measuring apparatus and positioning method using the same
摘要 In a laser interferometer type length measuring apparatus, a measurement laser beam will be influenced by disturbance such as air fluctuation and a change in air pressure distribution due to movement of an object so that a displacement of the object cannot be accurately measured. In order to obviate such an inconvenience, air controlled at a predetermined temperature is uniformly blown at a fixed speed on the entire optical path of the measurement laser beam.
申请公布号 US5141318(A) 申请公布日期 1992.08.25
申请号 US19910664603 申请日期 1991.03.04
申请人 HITACHI, LTD. 发明人 MIYAZAKI, CHUICHI;SAKAIZAWA, HIDEYUKI;KURIHARA, MAKOTO
分类号 G01B9/02;G01B11/00;G03F7/20 主分类号 G01B9/02
代理机构 代理人
主权项
地址