发明名称 |
SCANNING ELECTRON-BEAM EXPOSURE SYSTEM |
摘要 |
In a scanning electron-beam exposure system for exposing a desired rectangular area which is larger than a predetermined maximum rectangle, the desired rectangular area is divided into a plurality of areas. Two sets of such divided areas are shifted two-dimensionally from each other. The one set of divided areas are exposed with half of a predetermined electron-beam dose and the other set of divided areas are also exposed with half of the predetermined dose. This serves to reduce undesirable effects at boundaries between scanned areas. |
申请公布号 |
DE3379487(D1) |
申请公布日期 |
1989.04.27 |
申请号 |
DE19833379487 |
申请日期 |
1983.06.30 |
申请人 |
FUJITSU LIMITED |
发明人 |
KAWASHIMA, KENICHI;OSADA, TOSHIHIKO;NAKAGAWA, KENJI |
分类号 |
H01L21/027;H01J37/302;H01J37/317;H01L21/30;(IPC1-7):H01J37/302 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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