发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To obtain a semiconductor device having an excellent moisture resistance and to eliminate characteristics such as high temperature rhoV characteristic, boiling rhoV characteristic and boiling water absorption rate of sealing resin itself by containing specific contents of the hydroxide of alkali metal and/or alkali earth metal in an epoxy resin composition. CONSTITUTION:0.001-0.015g equivalent/kg of hydroxide of alkali metal and/or alkali earth metal is contained in epoxy resin composition made of epoxy resin, epoxy resin hardener and inorganic filler of sealing material. If less than 0.001g equivalent, corrosion resistance effect of aluminum electrode due to permeating water can be hardly effectively performed, while if more than 0.05g equivalent, the high temperature rhoV characteristic, boiling rhoV characteristic and boiling water absorption rate of a semiconductor device are deteriorated. The epoxy resin may use any of two ore more epoxy groups in one molecule like resin sealing molding material such as bis-phenol A-type epoxy resin.</p>
申请公布号 JPS61110451(A) 申请公布日期 1986.05.28
申请号 JP19840232084 申请日期 1984.11.02
申请人 NITTO ELECTRIC IND CO LTD 发明人 ITO TATSUSHI;TABATA HARUO;SUZUKI HIDETO;YAMASHITA RYOICHI
分类号 C08G59/00;C08G59/18;C08L63/00;H01L23/29;H01L23/31 主分类号 C08G59/00
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