发明名称 |
Automatic variable rate evaporation source for thin film deposition |
摘要 |
An apparatus for automatically controlling the rate of vacuum deposition of thin films on a substrate, consisting of an optical diaphragm or shutter in the form of two overlapping plates which together define a shutter opening between an evaporation crucible and a substrate. The overlapping plates are attached to a pair of rack gears to be moved in opposite directions by a pinion gear to vary the size of the shutter opening through which the evaporated material must pass to be deposited on the substrate. The rate of evaporation is sensed by a quartz crystal monitor and a signal therefrom is compared to a reference signal. The difference between the two signals is used to control the movement of the apertured plates thereby correcting the rate of deposition of the thin film.
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申请公布号 |
US4579083(A) |
申请公布日期 |
1986.04.01 |
申请号 |
US19850725331 |
申请日期 |
1985.04.19 |
申请人 |
CANADIAN PATENTS AND DEVELOPMENT LIMITED |
发明人 |
BOIVIN, GERMAIN |
分类号 |
C23C14/22;C23C14/54;(IPC1-7):C23C14/54 |
主分类号 |
C23C14/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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