发明名称 Automatic variable rate evaporation source for thin film deposition
摘要 An apparatus for automatically controlling the rate of vacuum deposition of thin films on a substrate, consisting of an optical diaphragm or shutter in the form of two overlapping plates which together define a shutter opening between an evaporation crucible and a substrate. The overlapping plates are attached to a pair of rack gears to be moved in opposite directions by a pinion gear to vary the size of the shutter opening through which the evaporated material must pass to be deposited on the substrate. The rate of evaporation is sensed by a quartz crystal monitor and a signal therefrom is compared to a reference signal. The difference between the two signals is used to control the movement of the apertured plates thereby correcting the rate of deposition of the thin film.
申请公布号 US4579083(A) 申请公布日期 1986.04.01
申请号 US19850725331 申请日期 1985.04.19
申请人 CANADIAN PATENTS AND DEVELOPMENT LIMITED 发明人 BOIVIN, GERMAIN
分类号 C23C14/22;C23C14/54;(IPC1-7):C23C14/54 主分类号 C23C14/22
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