发明名称 EMISSION SPECTROSCOPIC ANALYZING APPARATUS
摘要 PURPOSE:To improve resolving power, precision and S/N by inputting the number of a slit plate from a console, and setting automatically a voltage of a spectroscopic detector suitable for the slit width basing on the input information. CONSTITUTION:Spectral light generated by many metal elements contained in a sample is emitted from high-temp. flames of a plasma torch 1. The light is introduced to a collimating mirror 6 through a lense 2, reflecting mirros 3, 4 and an incident slit 5, furthermore introduced to a grating 7 to rotate said light, and the spectral light of each element is selected. Then, the spectral light is passed through an emitting slit 9 from a camera mirror 8 and detected by a photomultiplier 10. The detected signal is amplified by an amplifier 11, and inputted to an A/D converter 13 through a main amplifier 12. Here, the slits 5, 9 used for the spectroscope having three kinds of gap widths are prepared, and a hole of 2 bits is opened at the specified position so that the decision of the slit number can be detected.
申请公布号 JPS60128313(A) 申请公布日期 1985.07.09
申请号 JP19830236280 申请日期 1983.12.16
申请人 HITACHI SEISAKUSHO KK 发明人 KAWACHI KATSUO;KAMITAKE SEIGO
分类号 G01J3/04;(IPC1-7):G01J3/04 主分类号 G01J3/04
代理机构 代理人
主权项
地址