发明名称 Ionization chamber for measuring the profile of a radiation field of electron or X-ray radiation.
摘要 An ionization chamber for measuring the profile of a radiation field (R) is provided which comprises a first electrode (8) and a second electrode (10) arranged parallel to each other, both electrodes (8, 10) forming a gap (12) therebetween. A shield (14) made of a material opaque to ions produced by the radiation field (R) is movably arranged in said gap (12). It contains an aperture (16) which forms a measuring volume between said electrodes (8, 10). The ionization chamber further comprises means (24) for slideably moving the shield (14) along the gap (12). Thereby, the radiation profile can be measured.
申请公布号 EP0143996(A2) 申请公布日期 1985.06.12
申请号 EP19840113152 申请日期 1984.10.31
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 CHAMBERLAIN, JERRY E.
分类号 G01T1/185;G01T1/29;H01J47/02;(IPC1-7):G01T1/29 主分类号 G01T1/185
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