发明名称 CIRCUIT TEST SYSTEM
摘要 PURPOSE:To automatically test a circuit and a trunk being on an operation state, by a simple start command, so that its result can be displayed, in a circuit test system of a switchboard group which constitutes a network. CONSTITUTION:When a trunk circuit test command is inputted from an input/output apparatus TYP by a person in charge of maintenace, a processor SP sends out an instruction to a testing device TSTE in accordance with a command. As a result, TSTE decodes the instruction by an interface circuit INT, and drives a sequence controlling circuit SEQ.CTL. The circuit SEQ.CTL starts incoming to an incoming trunk ICT by a starting circuit SEZ.CKT, confirms a dial tone by a dial tone detector DTD, and conforms that the center station is normal. After that, when an office number which has been received from the processor SP and a special number of an automatic response trunk are sent out by driving a sender SND, they are stored in a register REG of the center station, and after that, are sent out to a terminal station from the sender SND, are connected to the automatic response trunk ATT, and its response tone is detected by a detector AAFD and is stored.
申请公布号 JPS5718156(A) 申请公布日期 1982.01.29
申请号 JP19800093445 申请日期 1980.07.09
申请人 NIPPON ELECTRIC CO 发明人 KOBAYASHI TSUNEO
分类号 H04M3/26;H04M3/28;H04M3/32 主分类号 H04M3/26
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