发明名称 Nonvolatile semiconductor memory that eases the dielectric strength requirements
摘要 An object of the present invention is to ease the dielectric strength requirements for transistors forming power supply circuits or the like. A nonvolatile semiconductor memory of the present invention includes a plurality of memory cells, each of which is composed of a floating gate, a control gate, a drain, and a source, and a negative voltage generating means whose generated negative voltage is applied to the control gate for drawing a charge stored in the floating gate into a channel or the source when stored data is erased electrically. The nonvolatile memory of the present invention further includes positive erasure voltage generating means, and a positive voltage higher than a conventional supply voltage generated by the positive erasure voltage generating means is applied to the channel or the source.
申请公布号 US5581107(A) 申请公布日期 1996.12.03
申请号 US19940358604 申请日期 1994.12.14
申请人 FUJITSU LIMITED 发明人 KAWAMURA, SHOUICHI;TAKASHINA, NOBUAKI;KASA, YASUSHI;ITANO, KIYOSHI
分类号 H01L21/8247;G11C16/04;G11C16/14;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/80;H01L27/02;H01L29/78 主分类号 H01L21/8247
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