发明名称 X-RAY FLUORESCENT EMISSION ANALYSIS TO DETERMINE MATERIAL CONCENTRATION
摘要 <p>A method and apparatus is disclosed to determine a concentration of dopant in soot that constitutes at least a portion of a soot preform (12) used to form an optical wave guide. The photon source (30) irradiates the soot preform on a mandrel (14). X-ray fluorescent emissions, from the irradiated soot are detected, and the concentration of dopant is determined based on the detected X-ray fluorescent emissions. Additionally, the concentration of dopant in layers of soot on the preform can be controlled by utilizing the detected X-ray fluorescent emissions to determine a deviation between a concentration of dopant in the soot and a predetermined concentration, and adjusting deposition conditions based on the deviation.</p>
申请公布号 WO2000037929(A1) 申请公布日期 2000.06.29
申请号 US1999028951 申请日期 1999.12.06
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