发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR WAFER
摘要 PURPOSE: A method for manufacturing a semiconductor wafer is provided to improve a yield by equally coating the wafers with a constant thickness using a chemical. CONSTITUTION: A fabrication method of semiconductor wafers comprises the first step(S100) for detecting a temperature of the semiconductor wafer, the second step(S110) for detecting a temperature of a chemical for coating the semiconductor wafer, the third step(S120) for deciding whether the semiconductor wafer temperature is same with the chemical temperature or not and the fourth step(S130) for continuously controlling the temperatures of both the semiconductor wafer and the chemical to be same when the temperatures are not corresponding with each other. At this point, the chemical is a photoresist.
申请公布号 KR20020072000(A) 申请公布日期 2002.09.14
申请号 KR20010011934 申请日期 2001.03.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SU YEOL
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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