发明名称 Intergrated circuit devices including an interfacial dipole layer
摘要 An integrated circuit device includes a first transistor structure formed in a memory region (e.g., an embedded memory region) of a die. The first transistor structure includes a substrate (e.g., a planar substrate of a planar FET or a fin of a FinFET) and a first gate. The first gate includes a dipole layer proximate to the substrate and a barrier layer proximate to the dipole layer. The integrated circuit device further includes a second transistor structure formed in a logic device region of the die. The second transistor structure includes a second gate that includes an interface layer, a dielectric layer, and a cap layer. The dielectric layer is formed between the cap layer and the interface layer.
申请公布号 US9620612(B2) 申请公布日期 2017.04.11
申请号 US201514625974 申请日期 2015.02.19
申请人 QUALCOMM Incorporated 发明人 Xu Jeffrey Junhao;Li Xia
分类号 H01L29/51;H01L29/66;H01L29/78;H01L27/08;H01L27/088;H01L21/28;H01L27/11592;G11C11/22 主分类号 H01L29/51
代理机构 Toler Law Group, PC 代理人 Toler Law Group, PC
主权项 1. An integrated circuit device, comprising: a first transistor structure in a memory region of a die, the first transistor structure having a substrate and a first gate, the first gate including a dipole layer proximate to the substrate and a barrier layer proximate to the dipole layer; and a second transistor structure in a logic device region of the die, the second transistor structure having a second gate, the second gate including an interface layer, a dielectric layer, and a cap layer, the dielectric layer between the cap layer and the interface layer.
地址 San Diego CA US