发明名称 A semiconductor wafer with a heteroepitaxial layer and a method for producing the wafer
摘要 <p>A semiconductor wafer comprising a substrate having a first side and a second side; a fully or partially relaxed heteroepitaxial layer deposited on the first side of the substrate; and a stress compensating layer deposited on the second side of the substrate. The wafer is produced in a method comprising depositing on a first side of a substrate a fully or partially relaxed heteroepitaxial layer at a deposition temperature; and before cooling the wafer from the deposition temperature, providing a stress compensating layer on a second side of the substrate.</p>
申请公布号 EP2104135(A1) 申请公布日期 2009.09.23
申请号 EP20080005334 申请日期 2008.03.20
申请人 SILTRONIC AG 发明人 STORCK, PETER, DR.;VORDERWESTNER, MARTIN
分类号 H01L21/02;H01L21/20 主分类号 H01L21/02
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