发明名称 |
Method of fabricating a nitride-based semiconductor laser diode |
摘要 |
<p>Provided is a method of manufacturing a nitride-based semiconductor laser diode that can minimize optical absorption on a cavity mirror plane and improve the surface roughness of the cavity mirror plane. The method includes the steps of: forming on a (0001) GaN (gallium nitride) substrate (2) at least two masks spaced apart by a distance equal to a laser cavity length in stripes that extend along <11-20> direction; growing an n-GaN layer (20) on the GaN substrate (2) between the masks so that two (1-100) edges of the n-GaN layer (20) are thicker than the remaining regions thereof; sequentially stacking an n-clad layer (24), an active layer (26), and a p-clad layer (28) on the n-GaN layer (20) to form an edge-emitting laser cavity structure in which laser light generated in the active layer passes through a region of the n-clad layer (24) aligned laterally with the active layer (26) and is output; and etching a (1-100) plane of the laser cavity structure to form a cavity mirror plane (30).
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申请公布号 |
EP1777788(A3) |
申请公布日期 |
2007.11.28 |
申请号 |
EP20060253489 |
申请日期 |
2006.07.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SAKONG, TAN;SUNG, YOUN-JOON;PAEK, HO-SUN |
分类号 |
H01S5/323;H01S5/028;H01S5/10;H01S5/16;H01S5/343 |
主分类号 |
H01S5/323 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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