发明名称 METHOD OF AND CIRCUIT FOR BROWN-OUT DETECTION
摘要 A circuit and method for detecting a brown-out condition and providing a feed-forward transfer function in a power supply circuit. A comparison circuit is coupled to a delay element through a latch. A second delay element is connected between the first delay element and an input of the latch. The output of the first delay element is connected to a clamping circuit via a logic circuit. A first voltage is compared with a reference voltage to generate a comparison voltage, which is transmitted through the latch and the first delay element. The comparison voltage is monitored at an output of the first delay element. A brown-out condition occurs if the comparison voltage being monitored at the output of the first delay element results from the first voltage being less than the reference voltage.
申请公布号 US2015028916(A1) 申请公布日期 2015.01.29
申请号 US201414336665 申请日期 2014.07.21
申请人 Semiconductor Components Industries, LLC 发明人 Turchi Joel;Ptacek Karel;Mlcousek Radim
分类号 G01R19/165;G01R31/40;G01R19/00 主分类号 G01R19/165
代理机构 代理人
主权项 1. A method for detecting a brown-out condition, comprising: generating a comparison voltage by comparing a first voltage appearing at a first node with a reference voltage; setting a voltage at a second node in accordance with the comparison voltage; after a first delay, setting a voltage at a third node in accordance with the voltage at the second node; and monitoring the voltage at the third node and the comparison voltage, wherein the brown-out condition occurs if the voltage being monitored at the third node and the comparison voltage results from the first voltage being less than the reference voltage.
地址 Phoenix AZ US
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