| 主权项 |
1. A simulation method, comprising:
determining, by a computer, a non-defective status or a defective status due to multiple design parameters used to design a Static Random Access Memory cell based on a determination indicator and a search indicator, the determination indicator acquired by an operation simulation of the Static Random Access Memory cell, the search indicator acquired during the operation simulation, being different from the determination indicator, and being related to characteristics of the Static Random Access Memory cell; specifying, by the computer, a boundary between areas of the non-defective status and the defective status in a design space with one of the multiple design parameters as an origin based on a determination result of the non-defective status or the defective status of the multiple design parameters; performing, by the computer, the operation simulation at each of multiple sample points, in which a boundary point is acquired on the boundary between the areas of the non-defective status and the defective status by comparison using the search indicator between the multiple design parameters, and the multiple sample points are distributed by using a Monte Carlo simulation around the boundary point; determining, by the computer, a first point of the multiple sample points, which is determined as being in the defective status based on the determination indicator acquired by the operation simulation and is nearest the origin on the boundary; and determining, by the computer, the boundary point being the nearest the origin on the boundary of the areas of the non-defective status and the defective status as being the nearest the origin, when a distance between the boundary point and the first point is less than a threshold. |
