发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor device manufacturing method of an embodiment includes the steps of: forming a first insulating layer on a semiconductor substrate; forming on the first insulating layer an amorphous or polycrystalline semiconductor layer having a narrow portion; forming on the semiconductor layer a second insulating layer having a thermal expansion coefficient larger than that of the semiconductor layer; performing thermal treatment; removing the second insulating layer; forming a gate insulating film on the side faces of the narrow portion; forming a gate electrode on the gate insulating film; and forming a source-drain region in the semiconductor layer.
申请公布号 US2015097189(A1) 申请公布日期 2015.04.09
申请号 US201414568227 申请日期 2014.12.12
申请人 Kabushiki Kaisha Toshiba 发明人 Saitoh Masumi;Numata Toshinori;Nakabayashi Yukio
分类号 H01L29/66;H01L29/786 主分类号 H01L29/66
代理机构 代理人
主权项
地址 Tokyo JP