| 摘要 |
A test circuit of a display panel and a test method thereof. The display panel comprises a plurality of subpixels which are distributed in an array, wherein each subpixel is controlled by a charge-charging gate line (C) and a charge-sharing gate line (S). The test circuit comprises a first data test pad (Dr), a second data test pad (Dg), a third data test pad (Db) and k gate test pads (G(k)), wherein the first data test pad, the second data test pad and the third data test pad are electrically coupled with a plurality of red subpixels, a plurality of green subpixels and a plurality of blue subpixels respectively; the charge-sharing gate line coupled with the subpixels of the display panel in the mth row are connected with the charge-charging gate line coupled with the subpixels in the (m+2n)th row, m is a positive integer, and n is a positive integer not less than 2; when the row number to which any row of subpixels belong is divided by k and a remainder is q, the qth gate test pad is electrically connected with the charge-charging gate line coupled with the subpixels in the mentioned row, both k and q are positive integers, and 2n cannot be exactly divided by k. The charge-charging gate line and the charge-sharing gate line which are coupled with any subpixel have different electric potentials, so that point defects of the display panel can be tested out better. |
