| 摘要 |
The invention relates to a magnetic field sensor device (10) for measuring at least one magnetic field vector component He, comprising at least one anisotropic magnetoresistive resistance device (AMR resistance device) (14) arranged on a chip substrate (12), wherein the resistance device (14) comprises a plurality of magnetoresistive AMR resistance elements (16), which are contacted by electrical conducting strips (18) in series. At least one permanently magnetic magnetization element (20) having a magnetization axis (22) is associated with each resistance element (16) in such a way that a bias field Ho of the magnetization element (20) passes through the resistance element (16) in the direction of the magnetization axis (22). A measurement current Is flowing through the resistance element (16) from a contact region (24) between a first conducting strip (18a) and the resistance element (16) to a contact region (26) between the resistance element (16) and a second conducting strip (18b) has an average current direction axis (28) that is at a linearization angle α > 0° and α < 90° (30) to the magnetization axis (22), which linearization angle can be predefined. The invention proposes a highly sensitive magnetic field sensor device (10) that can be economically produced in large quantities. |
