Application of open and/or short structures to bisect de-embedding

摘要

Application of open and short structures may result in improved accuracy in determination of ABCD parameters of a substantially symmetric two-port network for purposes of bisect de-embedding. Either one or both of the open and/or short techniques may be used to improve results of an ABCD optimization algorithm. Bisect de-embedding may then be performed to determine the ABCD parameters of a device under test based on the ABCD parameters of the substantially symmetric two-port network and measured s-parameters of the substantially symmetric two-port network and the embedded device under test.

主权项

1. A method comprising:
measuring transmission characteristics of a substantially symmetric two-port network including a first half and a second half; measuring at least one of transmission characteristics of the first half of the substantially symmetric two-port network having a short-circuited output and transmission characteristics of the first half of the substantially symmetric two-port network having an open-circuited output; determining transmission characteristics of the substantially symmetric two-port network based on the transmission characteristics of the substantially symmetric two-port network and one or both of the transmission characteristics of the first half of the substantially symmetric two-port network having a short-circuited output and the transmission characteristics of the first half of the substantially symmetric two-port network having an open-circuited output; measuring transmission characteristics of the substantially symmetric two-port network having a device under test embedded between the first half and the second half; and mathematically removing the transmission characteristics of the first half of the first substantially symmetric two-port network and the second half of the second substantially symmetric two-port network from the measured transmission characteristics of the substantially symmetric two-port network having a device under test embedded between the first half and the second half to determine transmission characteristics of the device under test.