发明名称 |
COMPENSATION OF CHANGES IN MEMS CAPACITIVE TRANSDUCTION |
摘要 |
A method for compensating for strain on a MEMS device includes generating a signal indicative of a strain on the MEMS device in a first mode of operating a system including the MEMS device. The method includes compensating for the strain in a second mode of operating the system based on the signal. Generating the signal may include comparing an indicator of a resonant frequency of the MEMS device to a predetermined resonant frequency of the MEMS device. Generating the signal may include comparing a first output of a strain-sensitive device to a second output of a strain-insensitive device and generating an indicator thereof. Generating the signal may include sensing a first capacitive transduction of strain-sensitive electrodes of the MEMS device in the first mode and generating the signal based thereon. The strain-sensitive electrodes of the MEMS device may be disabled in the second mode. |
申请公布号 |
US2014253219(A1) |
申请公布日期 |
2014.09.11 |
申请号 |
US201313786686 |
申请日期 |
2013.03.06 |
申请人 |
SILICON LABORATORIES INC. |
发明人 |
Caffee Aaron;Quevy Emmanuel P. |
分类号 |
B81B7/00 |
主分类号 |
B81B7/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method of compensating for strain on a microelectromechanical system (MEMS) device comprising:
generating a signal indicative of a strain on the MEMS device in a first mode of operating a system including the MEMS device; and compensating for the strain in a second mode of operating the system based on the signal. |
地址 |
Austin TX US |