发明名称 |
DEVICE AND METHOD FOR PERFORMING TIMING ANALYSIS |
摘要 |
A device for performing timing analysis used in a programmable logic array system is provided. The device comprises first and second basic I/O terminals, a channel multiplexer, high-speed I/O terminals, a sampling module and a timing analysis module. The first basic I/O terminals receive under-test signals from an under-test unit. The channel multiplexer receives the under-test signals from the first basic I/O terminals to select at least a group of the under-test signals to be outputted to the second basic I/O terminals. The high-speed I/O terminals has a logic level analyzing speed higher than that of the first and second basic I/O terminals. The sampling module receives the group of under-test signals from the high-speed I/O terminals and samples the group of under-test signals to generate a sample result. The timing analysis module performs timing analysis and measurement according to the sample result. |
申请公布号 |
US2014201581(A1) |
申请公布日期 |
2014.07.17 |
申请号 |
US201313798879 |
申请日期 |
2013.03.13 |
申请人 |
TEST RESEARCH, INC. |
发明人 |
SHEN Yu-Chen;Hsu Yi-Hao |
分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
1. A device for performing timing analysis used in a programmable logic array system comprising:
a plurality of first basic I/O terminals to receive a plurality of under-test signals from an under-test unit; a plurality of second basic I/O terminals; a channel multiplexer to receive the under-test signals from the first basic I/O terminals to select at least a group of the under-test signals to be outputted to the second basic I/O terminals; a plurality of high-speed I/O terminals having a logic level analyzing speed higher than that of the first and second basic I/O terminals, wherein the high-speed I/O terminals are connected to the second basic I/O terminals; a sampling module to receive the group of under-test signals outputted from the second basic I/O terminals through the high-speed I/O terminals and to sample the group of under-test signals to generate a sample result; and a timing analysis module to perform a timing analysis and measurement according to the sample result. |
地址 |
Taipei City TW |