发明名称 WAFER TRANSFER DEVICE AND WAFER INSPECTION APPARATUS COMPRISING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a wafer transfer device capable of linearly transferring a wafer in a levitated state, and a wafer inspection apparatus comprising the same.SOLUTION: A wafer transfer device 4 includes: a levitation unit 21 that levitates a wafer 2; a transfer mechanism 23 that pushes out the wafer 2 in a transfer direction; and an air ejector 25 that makes air flow to the wafer 2 from a transfer-direction downstream side with respect to the wafer 2. The transfer mechanism 23 has a push-out part 41 that pushes out a transfer-direction upstream side end surface of the wafer 2 in the transfer direction. A wafer inspection apparatus 1 comprises the wafer transfer device 4.
申请公布号 JP2014093441(A) 申请公布日期 2014.05.19
申请号 JP20120243483 申请日期 2012.11.05
申请人 JUST 发明人 YAMAGUCHI TAKESHI
分类号 H01L21/677;B65G49/07;B65G51/03;H01L21/66 主分类号 H01L21/677
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