MAGNETIC FIELD GENERATION UNIT AND SEMICONDUCTOR TEST APPARATUS INCLUDING THE SAME

摘要

A test apparatus can be provided which includes a test control unit configured to input electrical signals for testing a semiconductor device including a magneto-resistive element, and to receive test result signals from the semiconductor device. A station unit can be configured to support the semiconductor device during testing. A magnetic field generation unit can be configured to apply a magnetic field to the semiconductor device during testing. And a magnetic control unit can be configured to control the magnetic field generation unit. Using the test apparatus, characteristics of the semiconductor device can be tested during application of a magnetic field.