| 摘要 |
<p>The objective of the present invention is to receive a signal of a high speed mode and a low speed mode. In order to achieve the objective of the present invention, a test apparatus testing a device under test includes: a low speed comparator; a high speed comparator capable of operating in a higher speed than the low speed comparator; a switching part switching with which one of the low speed comparator and the high speed comparator to test a tested signal outputted by the device under test, on the ground of the signal outputted from the device under test. The test apparatus may further include a termination resistor installed in parallel with the high speed comparator.</p> |
