发明名称 |
Interlock Switch Circuit with Single Fault Detection |
摘要 |
A testing system to test safety interlock switches to ensure that they are operating normally comprising a test loop circuit 16 which connects in series a plurality of safety switches 2, the test loop circuit 16 is adapted to open the switches 2 outputs if broken, the testing system further comprising a diagnostic means 18 which checks each switch to ensure it is operating normally when the test loop circuit 16 is broken. The test loop circuit 16 may be broken when a single switch 2 is activated to open its safety output.
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申请公布号 |
US2013285666(A1) |
申请公布日期 |
2013.10.31 |
申请号 |
US201313853003 |
申请日期 |
2013.03.28 |
申请人 |
IDEM SAFETY SWITCHES LIMITED |
发明人 |
MOHTASHAM MEDI;FARIDFAR HAMED;CROLLA VINCENT;JENNINGS TIMOTHY |
分类号 |
G01R31/327 |
主分类号 |
G01R31/327 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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