发明名称 Interlock Switch Circuit with Single Fault Detection
摘要 A testing system to test safety interlock switches to ensure that they are operating normally comprising a test loop circuit 16 which connects in series a plurality of safety switches 2, the test loop circuit 16 is adapted to open the switches 2 outputs if broken, the testing system further comprising a diagnostic means 18 which checks each switch to ensure it is operating normally when the test loop circuit 16 is broken. The test loop circuit 16 may be broken when a single switch 2 is activated to open its safety output.
申请公布号 US2013285666(A1) 申请公布日期 2013.10.31
申请号 US201313853003 申请日期 2013.03.28
申请人 IDEM SAFETY SWITCHES LIMITED 发明人 MOHTASHAM MEDI;FARIDFAR HAMED;CROLLA VINCENT;JENNINGS TIMOTHY
分类号 G01R31/327 主分类号 G01R31/327
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