| 摘要 |
<p>The method involves producing a frequency-modulated laser beam, and emitting the laser beam as a measuring radiation (MS) on a surface (7'') of an industrial workpiece. The measuring radiation scattered back to the surface is received. The measuring radiation is emitted and received during a scanning guidance over the surface. Deviations are algorithmically considered from perpendicular impinging of the measuring radiation on the surface and/or are avoided or reduced during the scanning guidance by controlling the emission of the measuring radiation. An independent claim is also included for a measuring device for measuring surfaces of an industrial workpiece.</p> |
