发明名称 |
SYSTEMS AND METHODS FOR DEFECT DETECTION USING EXOELECTRONS |
摘要 |
An defect detection system includes an exoemission sensor having a conductive layer and an insulating layer. The exoemission sensor is mountable to a material of interest and configured to receive exoemissions from the material while in an atmosphere. The exoemission sensor outputs a signal based upon the received emissions. An analysis device is configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal.
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申请公布号 |
US2013153781(A1) |
申请公布日期 |
2013.06.20 |
申请号 |
US201113325731 |
申请日期 |
2011.12.14 |
申请人 |
WEAVER STANTON EARL;MICHAEL JOSEPH DARRYL |
发明人 |
WEAVER STANTON EARL;MICHAEL JOSEPH DARRYL |
分类号 |
G01T1/00 |
主分类号 |
G01T1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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