发明名称 SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device and a method for manufacturing the same are provided to improve an electrical characteristic by forming a copper line structure which has a metal pattern and no void. CONSTITUTION: A substrate(100) includes a cell region and a peripheral circuit region. A trench(120) is formed in the upper part of an interlayer insulating layer(110). A line structure(180) fills a trench passing through a part of the interlayer insulating layer. The line structure includes a barrier layer pattern(135), a metal pattern(175), and a wetting promotion layer pattern(165). The metal pattern has no void. The wetting promotion film pattern is formed in the central part of the trench.
申请公布号 KR20130060432(A) 申请公布日期 2013.06.10
申请号 KR20110126479 申请日期 2011.11.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG, JONG WON;KIM, HEI SEUNG;NAM, KYOUNG HEE;PARK, IN SUN;LEE, JONG MYEONG
分类号 H01L21/28;H01L21/8229;H01L27/105 主分类号 H01L21/28
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