发明名称 |
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a method for manufacturing the same are provided to improve an electrical characteristic by forming a copper line structure which has a metal pattern and no void. CONSTITUTION: A substrate(100) includes a cell region and a peripheral circuit region. A trench(120) is formed in the upper part of an interlayer insulating layer(110). A line structure(180) fills a trench passing through a part of the interlayer insulating layer. The line structure includes a barrier layer pattern(135), a metal pattern(175), and a wetting promotion layer pattern(165). The metal pattern has no void. The wetting promotion film pattern is formed in the central part of the trench. |
申请公布号 |
KR20130060432(A) |
申请公布日期 |
2013.06.10 |
申请号 |
KR20110126479 |
申请日期 |
2011.11.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HONG, JONG WON;KIM, HEI SEUNG;NAM, KYOUNG HEE;PARK, IN SUN;LEE, JONG MYEONG |
分类号 |
H01L21/28;H01L21/8229;H01L27/105 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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