发明名称 Imprint lithography
摘要 An imprint lithography method is disclosed that includes, after imprinting an imprint lithography template into a layer of imprintable medium to form a pattern in that imprintable medium and fixing that pattern to form a patterned layer of imprintable medium, adding etch resistant material (i.e. a hard mask) to a part of the patterned layer of imprintable medium to reduce a difference between an intended topography and an actual topography of that part of the patterned layer of imprintable medium.
申请公布号 US8454849(B2) 申请公布日期 2013.06.04
申请号 US201113051441 申请日期 2011.03.18
申请人 WUISTER SANDER FREDERIK;BANINE VADIM YEVGENYEVICH;DEN BOEF ARIE JEFFREY;KRUIJT-STEGEMAN YVONNE WENDELA;RAKHIMOVA TATYANA VIKTOROVNA;LOPAEV DMITRIY VIKTOROVICH;GLUSHKOV DENIS ALEXANDROVICH;YAKUNIN ANDREI MIKHAILOVICH;KOOLE ROELOF;ASML NETHERLANDS B.V. 发明人 WUISTER SANDER FREDERIK;BANINE VADIM YEVGENYEVICH;DEN BOEF ARIE JEFFREY;KRUIJT-STEGEMAN YVONNE WENDELA;RAKHIMOVA TATYANA VIKTOROVNA;LOPAEV DMITRIY VIKTOROVICH;GLUSHKOV DENIS ALEXANDROVICH;YAKUNIN ANDREI MIKHAILOVICH;KOOLE ROELOF
分类号 B44C1/22;C23F1/00 主分类号 B44C1/22
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