| 摘要 |
<P>PROBLEM TO BE SOLVED: To prevent an increase in test time, facilitate fault diagnosis of scan chain and reduce fault diagnosis time for fault spot estimation. <P>SOLUTION: A system for narrowing a range of fault on a scan chain comprises: means 24 for narrowing a fault candidate scan FF with both of a test pattern in a bypass test mode and a test pattern in a compression test mode; means 23 for identifying a fault scan chain in the compression test mode from a difference in a scan chain structure between the compression test mode and the bypass test mode, and storing the identified scan chain into a storage unit; means 27 for converting a range of fault candidate in the bypass test mode into a range of scan FF in the compression test mode; and means 25 for using the test pattern in the compression test mode to apply fault simulation to the scan chain including the fault candidate, conducting collation with a test result in the compression test mode and outputting a collation result to an output device. <P>COPYRIGHT: (C)2013,JPO&INPIT |
