发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 A method for fabricating semiconductor device is disclosed. The method includes the steps of: providing a substrate, wherein the substrate comprises a gate structure thereon; forming a film stack on the substrate and covering the gate structure, wherein the film stack comprises at least an oxide layer and a nitride layer; removing a portion of the film stack for forming recesses adjacent to two sides of the gate structure and a disposable spacer on the sidewall of the gate structure; and filling the recesses with a material comprising silicon atoms for forming a faceted material layer.
申请公布号 US2012309171(A1) 申请公布日期 2012.12.06
申请号 US201113118473 申请日期 2011.05.30
申请人 LU TSUO-WEN;TENG WEN-YI;WANG YU-REN;HUANG GIN-CHEN;LIN CHIEN-LIANG;WANG SHAO-WEI;YEN YING-WEI;CHENG YA-CHI;CHAN SHU-YEN;YANG CHAN-LON 发明人 LU TSUO-WEN;TENG WEN-YI;WANG YU-REN;HUANG GIN-CHEN;LIN CHIEN-LIANG;WANG SHAO-WEI;YEN YING-WEI;CHENG YA-CHI;CHAN SHU-YEN;YANG CHAN-LON
分类号 H01L21/20 主分类号 H01L21/20
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